Material characterization - Analyzing methods

Optical light microscopy

• Microscope: Nikon Eclipse ME600 with LINKAM tempering device
• A reflected light microscope with a magnification of up to 1000x and a tempering device is used to analyze the microstructure of SMA in order to record and display the martensitic-austenitic transformation behavior. 

SEM - Scanning electron microscope

• EDX - Energy dispersive X-ray spectroscopy
• EBSD - Electron backscatter diffraction

XRD - X-ray diffractometer

DSC - Differential Scanning Calorimetry

• Device: Mettler Toledo DSC 3+
• The DSC is the first characterization we carry out for quality control purposes. The thermal properties such as the transformation temperatures and enthalpies are determined here.

DIL - Quenching and forming dilatometer

• Device: Bähr 805 A/D
• The dilatometer can be used to precisely heat and form materials, measuring the length of the sample with high accuracy. This enables to precisely determine and analyze the material behaviour and in particular the shape memory effects depending on the temperature.

Magnetic property determination using PERMAGRAPH         

• Device: MAGNET-PHYSIK, Messjoch EP 5
• The PERMAGRAPH® L is the compact version of a fully automatic, computer-controlled measuring systemfor recording magnetic parameters of hard magnetic materials. The measuring system is used in particular for the material characterization of magnetic shape memory alloys, whereby a magnetization of up to 2200 kA/m is possible.  

Tensile-compression testing machine

• Device: ZwickRoell
• General tests under tensile and compressive load; characterization of SMA as well as actuator and sensor systems